海量图书期刊资源,随时随地畅享阅读乐趣
Metal film characterization with qualified spreading resistanceT. Clarysse; I. Hoflijk; W. Zhang; K. Maex; W. Vandervorst · 2004
Towards nondestructive carrier depth profilingT. Clarysse; W. Vandervorst; M. Bakshi; L. Nicolaides; A. Salnik; J. Opsal · 2006
Active dopant characterization methodology for germaniumT. Clarysse; P. Eyben; T. Janssens; I. Hoflijk; D. Vanhaeren; A. Satta; M. Meuris; W. Vandervorst; J. Bogdanowicz; G. Raskin · 2006
An efficient smoothing algorithm for spreading resistance calculationsT. Clarysse; W. Vandervorst · 1988
Fabrication of cantilevers and double AFM tips for the NanoProfilerEdouard Duriau; T. Clarysse; T. Hantschel; W. Vandervorst · 2007
New SPM concept for accurate and repeatable tip positioningE. Duriau; T. Clarysse; A. Moussa; D. Vanhaeren; P. Eyben; T. Hantschel; W. Vandervorst · 2009
Stability analysis of correction schemes for spreading resistance measurementsT. Clarysse; W. Vandervorst · 1990