![[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Statistics for electromigration testing]()
[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Statistics for electromigration testingSchafft, H.; Lechner, J.A.; Sabi, B.; Mahaney, M.; Smith, R.C. · 1988