The instantaneous-space-phasor: a powerful diagnosis tool
- 作者Milanez, D.L.; Emanuel, A.E.
- 卷第52卷
- 期第1期
- 印刷ISSN0018-9456
- 电子ISSN1557-9662
- 文件大小455.82KB
- 发表时间2003
- DOI10.1109/tim.2003.809069
- 页码143-148
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[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparisonAlippi, C.; Catelani, M.; Fort, A.; Mugnaini, M. · 2003
[IEEE IMTC/2002. 19th IEEE Instrumentation and Measurement Technology Conference - Anchorage, AK, USA (21-23 May 2002)] IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) - Automatic selection of test frequencies for the diagnosis of soft faults in analog circuitsAlippi, C.; Catelani, M.; Fort, A.; Mugnaini, M. · 2002