![[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparison]()
[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparisonAlippi, C.; Catelani, M.; Fort, A.; Mugnaini, M. · 2003