![Effect of argon gas pressure on residual stress, microstructure evolution and electrical resistivity of beryllium films]()
Effect of argon gas pressure on residual stress, microstructure evolution and electrical resistivity of beryllium filmsLuo, Bing-Chi; Li, Kai; Zhang, Ji-Qiang; Luo, Jiang-Shan; Wu, Wei-Dong; Tang, Yong-Jian · Journal of the Korean Physical Society · 2016