Identification of design errors through functional testingFerrandi, F.; Fummi, F.; Pravadelli, G.; Sciuto, D. · 2003

Symbolic optimization of interacting controllers based on redundancy identification and removalFerrandi, F.; Fummi, F.; Macii, E.; Poncino, M.; Sciuto, D. · 2000

Test generation and testability alternatives exploration of critical algorithms for embedded applicationsFerrandi, F.; Fummi, F.; Sciuto, D. · 2002

[IEEE Comput. Soc. Press Great Lakes Symposium on VLSI - Urbana-Champaign, IL, USA (13-15 March 1997)] Proceedings Great Lakes Symposium on VLSI - How an "evolving" fault model improves the behavioral test generationBuonanno, G.; Ferrandi, F.; Ferrandi, L.; Fummi, F.; Sciuto, D. · 1997

[IEEE Comput. Soc Design, Automation and Test in Europe - Paris, France (23-26 Feb. 1998)] Proceedings Design, Automation and Test in Europe - Power estimation of behavioral descriptionsFerrandi, F.; Fummi, F.; Macii, E.; Poncino, M.; Sciuto, D. · 1998

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Testability alternatives exploration through functional testingFerrandi, F.; Ferrara, G.; Fornara, G.; Fummi, F.; Sciuto, D. · 2000

[ACM 33rd Design Automation Conference - Las Vegas, NV, USA (3-7 June 1996)] 33rd Design Automation Conference Proceedings, 1996 - Symbolic optimization of FSM networks based on sequential ATPG techniquesFerrandi, F.; Fummi, F.; Macii, E.; Poncino, M.; Sciuto, D. · 1996