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[IEEE 2010 IEEE International Conference on Electro/Information Technology (EIT 2010) - Normal, IL, USA (2010.05.20-2010.05.22)] 2010 IEEE International Conference on Electro/Information Technology - Conference program2010
[IEEE 2010 IEEE International Conference on Electro/Information Technology (EIT 2010) - Normal, IL (2010.05.20-2010.05.22)] 2010 IEEE International Conference on Electro/Information Technology - Help2010
[IEEE 2010 IEEE International Conference on Industrial Technology (ICIT 2010) - Vina del Mar (2010.03.14-2010.03.17)] 2010 IEEE International Conference on Industrial Technology - [Cover page]2010
[IEEE 2010 IEEE International Conference on Industrial Technology - Vi a del Mar , Chile (2010.03.14-2010.03.17)] 2010 IEEE International Conference on Industrial Technology - RFID technology and applications2010
[IEEE 2010 IEEE International Conference on Industrial Technology - Vi a del Mar , Chile (2010.03.14-2010.03.17)] 2010 IEEE International Conference on Industrial Technology - Hybrid/electric vehicle technology2010
[IEEE 2010 IEEE International Conference on Electro/Information Technology (EIT 2010) - Normal, IL, USA (2010.05.20-2010.05.22)] 2010 IEEE International Conference on Electro/Information Technology - Conference administrator welcome2010
[IEEE 2010 IEEE International Conference on Electro/Information Technology (EIT 2010) - Normal, IL (2010.05.20-2010.05.22)] 2010 IEEE International Conference on Electro/Information Technology - Author index2010
[IEEE 2010 IEEE International Conference on Electro/Information Technology (EIT 2010) - Normal, IL, USA (2010.05.20-2010.05.22)] 2010 IEEE International Conference on Electro/Information Technology - Welcome2010
[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Hot carrier degradation in nanowire (NW) FinFETsMaiti, T. K.; Bera, M. K.; Mahato, S. S.; Chakraborty, P.; Mahata, C.; Sengupta, M.; Chakraborty, A.; Maiti, C. K. · 2008
[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Stress-induced degradation in strain-engineered nMOSFETsMaiti, T. K.; Mahato, S. S.; Bera, M. K.; Sengupta, M.; Chakraborty, P.; Mahata, C.; Chakraborty, A.; Maiti, C. K. · 2008
[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - DIBL in short-channel strained-Si n-MOSFETMahato, S. S.; Chakraborty, P.; Maiti, T. K.; Bera, M. K.; Mahata, C.; Sengupta, M.; Chakraborty, A.; Sarkar, S. K.; Maiti, C. K. · 2008
[IEEE 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2012.09.19-2012.09.21)] 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Polycrystalline p-β-FeSi<inf>2</inf>(Al) on n-Si(100): Heterojunction thin-film solar cellsBag, A.; Mallik, S.; Mahata, C.; Maiti, C. K. · 2012