Partner selection in virtual enterprises: a multi-criteria decision support approach
- 期刊名称International Journal of Production Research
- 作者Crispim, José António; Pinho de Sousa, Jorge
- 卷第47卷
- 期第17期
- 印刷ISSN0020-7543
- 电子ISSN1366-588X
- 文件大小655.48KB
- 发表时间2009-09
- DOI10.1080/00207540902847348
- 页码4791-4812
[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - 2007 International Reliability Physics Symposium2007
[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings - Phoenix, AZ (2007.4.15-2007.4.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - [Front cover]2007
[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - 2007 IRPS Reliability Year in Review Seminar2007
[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Biographies2007
[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - awards2007
[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Preface2007
[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Copyright page2007
[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - 2007 IRPS Tutorial Program2007
The Energy-Driven Hot Carrier Degradation Modes of nMOSFETsGuerin, C.; Huard, V.; Bravaix, A. · IEEE Transactions on Device and Materials Reliability · 2009
General framework about defect creation at the SiâSiO[sub 2] interfaceGuerin, C.; Huard, V.; Bravaix, A. · Journal of Applied Physics · 2009
[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - New Hot-Carrier Lifetime Technique for High- to Low-Supplied Voltage nMOSFETsGuerin, C.; Parthasarathy, C.; Huard, V.; Bravaix, A. · 2007
[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Unified Perspective of NBTI and Hot-Carrier Degradation in CMOS using on-the-Fly Bias PatternsParthasarathy, CR; Denais, M; Huard, V.; Guerin, C.; Ribes, G.; Vincent, E.; Bravaix, A. · 2007