![[IEEE 2011 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Kota Kinabalu, Sabah, Malaysia (2011.09.28-2011.09.30)] 2011 IEEE Regional Symposium on Micro and Nano Electronics - Influence of the gate thickness on the memory behavior of MFIS-FETs]()
[IEEE 2011 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Kota Kinabalu, Sabah, Malaysia (2011.09.28-2011.09.30)] 2011 IEEE Regional Symposium on Micro and Nano Electronics - Influence of the gate thickness on the memory behavior of MFIS-FETsSaif, Ala'eddin A.; Jamal, Z. A. Z.; Sauli, Z.; Poopalan, P. · 2011