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- 期刊名称Avian Diseases
- 卷第56卷
- 期第3期
- 印刷ISSN0005-2086
- 电子ISSN1938-4351
- 文件大小2052.55KB
- 发表时间2012-09
- DOI10.1637/0005-2086-56.3.c2
[IEEE 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices (RSAMD) - Golden, CO, USA (2013.2.24-2013.2.25)] 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices - Reliability challenges of FinFET and other multi-gate MOSFETsMohseni, Javaneh; Meindl, James D. · 2013
[IEEE 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices (RSAMD) - Golden, CO, USA (2013.2.24-2013.2.25)] 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices - Electrical conduction effect on reliability of low-k dielectric in Cu interconnectLin, Mingte; Juan, Alex; Su, K. C. · 2013
[IEEE 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices (RSAMD) - Golden, CO, USA (2013.2.24-2013.2.25)] 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices - Advanced X-ray diffraction metrology as a means of improving semiconductor device reliabilityGittleman, Bruce · 2013
[IEEE 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices (RSAMD) - Golden, CO, USA (2013.2.24-2013.2.25)] 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices - A toolbox approach to reliably integrating MEMS gyroscopes into harsh acoustic and vibration environmentsDean, Robert N.; Flowers, George T. · 2013
[IEEE 2013 IEEE International Conference on Automation Science and Engineering (CASE 2013) - Madison, WI, USA (2013.08.17-2013.08.20)] 2013 IEEE International Conference on Automation Science and Engineering (CASE) - Monitoring virtual metrology reliability in a sampling decision systemKurz, Daniel; De Luca, Cristina; Pilz, Jurgen · 2013
[IEEE 2013 IEEE Third International Conference on Information Science and Technology (ICIST) - Yangzhou, Jiangsu, China (2013.03.23-2013.03.25)] 2013 IEEE Third International Conference on Information Science and Technology (ICIST) - A polynomial estimation algorithm for PN sequence based on reliability accumulationYang, Meiyue; Huang, Kaizhi; Luo, Wenyu · 2013
[IEEE 2013 IEEE 4th International Conference on Software Engineering and Service Science (ICSESS) - Beijing, China (2013.05.23-2013.05.25)] 2013 IEEE 4th International Conference on Software Engineering and Service Science - NHPP software reliability growth model incorporating fault detection and debuggingHe, Yan · 2013