[IEEE 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2013) - Chenzhen, China (2013.10.20-2013.10.23)] 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Surface potential decay measurements on fluorinated polymeric insulation for high voltage DC applications
- 作者Mohamad, A.; Chen, G.; Zhang, Y.; An, Z.
- 文件大小502.44KB
- 发表时间2013
- DOI10.1109/CEIDP.2013.6747065
- 页码1132-1135
[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - On the statistical trap-response (STR) method for characterizing random trap occupancy and NBTI fluctuationZou, Jibin; Liu, Changze; Wang, Runsheng; Xu, Xiaoqing; Liu, Jinhua; Wu, Hanming; Wang, Yangyuan; Huang, Ru · 2012
[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - New insights into AC RTN in scaled high-к / metal-gate MOSFETs under digital circuit operationsZou, Jibin; Wang, Runsheng; Gong, Nanbo; Huang, Ru; Xu, Xiaoqing; Ou, Jiaojiao; Liu, Changze; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Yu, Shaofeng; Ren, Pengpeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan · 2012
[IEEE 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Technology, System and Application - New observations on the AC random telegraph noise (AC RTN) in nano-MOSFETsRunsheng Wang, ; Jibin Zou, ; Xiaoqing Xu, ; Changze Liu, ; Jinhua Liu, ; Hanming Wu, ; Yangyuan Wang, ; Ru Huang, · 2012