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High speed Bias Temperature Instability measurements on 20nm RMG HKMG MOSFETsChandra, Nishant; Chandrashekhar, Sandhya; Francis, Rick; Kerber, Andreas; Srinivasan, Purushothaman; Nigam, Tanya · Solid-State Electronics · 2014
Determination of DC equivalent hot carrier stress times in scaled CMOS devices using novel AC stress methodologyKerber, Andreas; Nigam, Tanya · Microelectronics Reliability · 2019
Fast Wafer-Level Stress-and-Sense Methodology for Characterization of Ring-Oscillator Degradation in Advanced CMOS TechnologiesKerber, Andreas; Wan, Xinggong; Liu, Yang; Nigam, Tanya · IEEE Transactions on Electron Devices · 2015
[IEEE 2015 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Montpellier, France (2015.7.8-2015.7.10)] 2015 IEEE Computer Society Annual Symposium on VLSI - Enabling Scaling of Advanced CMOS Technologies: A Reliability PerspectiveNigam, Tanya; Kerber, Andreas · 2015