![[IEEE 2013 International Conference on Control, Automation, Robotics and Embedded Systems (CARE) - Jabalpur, India (2013.12.16-2013.12.18)] 2013 International Conference on Control, Automation, Robotics and Embedded Systems (CARE) - Impact of temperature variation on CNTFET device characteristics]()
[IEEE 2013 International Conference on Control, Automation, Robotics and Embedded Systems (CARE) - Jabalpur, India (2013.12.16-2013.12.18)] 2013 International Conference on Control, Automation, Robotics and Embedded Systems (CARE) - Impact of temperature variation on CNTFET device characteristicsSinha, Sanjeet Kumar; Chaudhury, Saurabh · 2013