A learning algorithm for a CMAC-based system and its application for classification of ultrasonic signalsT.R. Damarla; Wei Ning Zhao · 1994

[IEEE Conference Record. AUTOTESTCON '96 - Dayton, OH, USA (16-19 Sept. 1996)] Conference Record. AUTOTESTCON '96 - Design automation tools for built-in self-test implementationsTungate, S.; Ping He, ; Seshadri, S.; Stroud, C.; Sullivan, M.; Damarla, T.R. · 1996

[IEEE Conference Record. AUTOTESTCON '96 - Dayton, OH, USA (16-19 Sept. 1996)] Conference Record. AUTOTESTCON '96 - Register size vs. fault coverage in modified circular built-in self-testStroud, C.E.; Ping He, ; Damarla, T.R. · 1996

[IEEE Ninth Annual IEEE International ASIC Conference and Exhibit - Rochester, NY, USA (23-27 Sept. 1996)] Proceedings Ninth Annual IEEE International ASIC Conference and Exhibit - Efficient error bit identification from failing signaturesStroud, C.E.; Damarla, T.R. · 1996

[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - Improving the efficiency of error identification via signature analysisStroud, C.E.; Damarla, T.R. · 1995

[IEEE Comput. Soc. Press Twentieth International Symposium on Multiple-Valued Logic - Charlotte, NC, USA (23-25 May 1990)] Proceedings of the Twentieth International Symposium on Multiple-Valued Logic - Fault detection in multiple valued logic circuitsDamarla, T.R. · 1990

[IEEE Twelfth Annual IEEE International ASIC/SOC Conference - Washington, DC, USA (15-18 Sept. 1999)] Twelfth Annual IEEE International ASIC/SOC Conference (Cat. No.99TH8454) - Procedures for the development of legacy processor systems and a procedure verifying case-study exampleHeath, J.R.; Leong, W.D.; Stroud, C.; Damarla, T.R. · 1999