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Observation of Si-2p Level Shift in Hydrogenated Amorphous Silicon by X-Ray Photoelectron SpectroscopyUsami, Katsuhisa; Shimada, Toshikazu; Katayama, Yoshifumi · Japanese Journal of Applied Physics · 1980
XPS Determination of Amount of Incorporated Rare Gas in Amorphous Silicon Films Produced with Reactive Sputtering MethodUsami, Katsuhisa; Katayama, Yoshifumi; Shimada, Toshikazu · Japanese Journal of Applied Physics · 1980
Behavior of Plasmons in an Amorphous Silicon-Carbon Alloy System Studied by X-Ray Photoelectron SpectroscopyKatayama, Yoshifumi; Shimada, Toshikazu; Usami, Katsuhisa · Physical Review Letters · 1981
Recent developments in continuum percolationBalberg, I. · Philosophical Magazine Part B · 1987
Spontaneous spin polarization in quantum wiresFasol, Gerhard; Sakaki, Hiroyuki · Philosophical Magazine Part B · 1994
Wave propagation in disordered mediaRobinson, P. A. · Philosophical Magazine Part B · 2000
Absolute scale of thermoelectricity IIIRoberts, R. B.; Righini, F.; Compton, R. C. · Philosophical Magazine Part B · 1985
An improved Lindemann melting ruleLawson, A. C. · Philosophical Magazine Part B · 2001
Flow equations of HamiltoniansWegner, Franz · Philosophical Magazine Part B · 1998
Structural models of amorphous GeSDrchal, V.; Málek, J. · Philosophical Magazine Part B · 1988
Random tiling structure of icosahedral quasicrystalsElserf, Veit · Philosophical Magazine Part B · 1996