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[IEEE Testing: Academic &Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Windsor, UK (2006.08.29-2006.08.31)] Testing: Academic &Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Testing: Academic and Industrial Conference - Practice And Research Techniques - Cover2006
[IEEE Testing: Academic &Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Windsor, UK (2006.08.29-2006.08.31)] Testing: Academic &Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Testing: Academic and Industrial Conference - Practice And Research Techniques - TOC2006
[IEEE Testing: Academic &Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Windsor, UK (2006.08.29-2006.08.31)] Testing: Academic &Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Testing: Academic and Industrial Conference - Practice And Research Techniques - Title2006
[IEEE 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Windsor, United Kingdom (2009.09.4-2009.09.6)] 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Value Driven TestingSneed, Harry · 2009
[IEEE Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Windsor, UK (2007.09.10-2007.09.14)] Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Testing: Academic and Industrial Conference Practice and Research Techniques - Title2007
[IEEE Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Windsor, UK (2007.09.10-2007.09.14)] Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Testing: Academic and Industrial Conference Practice and Research Techniques - Cover2007
[IEEE Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Windsor, UK (29-31 Aug. 2006)] Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Testing a Datawarehouse - An Industrial ChallengeSneed, H.M. · 2006
[IEEE 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Windsor, United Kingdom (2009.09.4-2009.09.6)] 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Reviewers2009
[IEEE The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Trollhattan, Sweden (2007.11.5-2007.11.9)] The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Testing Security Policies: Going Beyond Functional TestingTraon, Yves Le; Mouelhi, Tejeddine; Baudry, Benoit · 2007
[IEEE 2008 International Conference on Software Testing, Verification, and Validation - Lillehammer, Norway (2008.04.9-2008.04.11)] 2008 International Conference on Software Testing, Verification, and Validation - Test-Driven Assessment of Access Control in Legacy ApplicationsTraon, Yves Le; Mouelhi, Tejeddine; Pretschner, Alexander; Baudry, Benoit · 2008
[IEEE 2009 International Conference on Software Testing Verification and Validation (ICST) - Denver, CO, USA (2009.04.1-2009.04.4)] 2009 International Conference on Software Testing Verification and Validation - Transforming and Selecting Functional Test Cases for Security Policy TestingMouelhi, Tejeddine; Traon, Yves Le; Baudry, Benoit · 2009
[IEEE 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation (ICST) - Berlin, Germany (2011.03.21-2011.03.25)] 2011 Fourth IEEE International Conference on Software Testing, Verification and Validation - Tailored Shielding and Bypass Testing of Web ApplicationsMouelhi, Tejeddine; Le Traon, Yves; Abgrall, Erwan; Baudry, Benoit; Gombault, Sylvain · 2011
[IEEE Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Windsor, UK (2007.09.10-2007.09.14)] Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Mutation Analysis for Security Tests QualificationMouelhi, Tejeddine; Le Traon, Yves; Baudry, Benoit · 2007
[IEEE 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Berlin, Germany (2011.03.21-2011.03.25)] 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops - Model Driven Mutation Applied to Adaptative Systems TestingBartel, Alexandre; Baudry, Benoit; Munoz, Freddy; Klein, Jacques; Mouelhi, Tejeddine; Le Traon, Yves · 2011