![[ECS 22nd Symposium on Microelectronics Technology and Devices - Rio De Janiero, Brasil (September 3 - September 6, 2007)] ECS Transactions - Stress Analysis on Ultra Thin Ground Wafers]()
[ECS 22nd Symposium on Microelectronics Technology and Devices - Rio De Janiero, Brasil (September 3 - September 6, 2007)] ECS Transactions - Stress Analysis on Ultra Thin Ground WafersTeixeira, R. C.; De Munck, K.; De Moor, P.; Baert, K.; Swinnen, B.; Van Hoof, C.; Kuttel, A. · 2007