![Transmission electron microscopy study of microstructural properties and dislocation characterization in the GaN film grown on the cone-shaped patterned Al2O3 substrate]()
Transmission electron microscopy study of microstructural properties and dislocation characterization in the GaN film grown on the cone-shaped patterned Al2O3 substratePark, J. S.; Yang, J.-M.; Park, K. J.; Park, Y. C.; Yoo, J. H.; Jeong, C. S.; Park, J.; He, Y.; Shin, K. · Microscopy · 2014