![Measurement Techniques to Identify Soft Failure Sensitivity to ESD]()
Measurement Techniques to Identify Soft Failure Sensitivity to ESDZhou, Jianchi; Guo, Yuandong; Shinde, Satyajeet; Hosseinbeig, Ahmad; Patnaik, Abhishek; Izadi, Omid Hoseini; Zeng, Chen; Shi, Jun; Maeshima, Junji; Shumiya, Hideki; Araki, Kenji; Pommerenke, David J. · IEEE Transactions on Electromagnetic Compatibility · 2019