![[AIP Stress-induced phenomena in metallization: Second international workshop - Austin, Texas (USA) (29−31 Mar 1993)] AIP Conference Proceedings - Characterization of stress migration in sub-micron metal interconnects]()
[AIP Stress-induced phenomena in metallization: Second international workshop - Austin, Texas (USA) (29−31 Mar 1993)] AIP Conference Proceedings - Characterization of stress migration in sub-micron metal interconnectsFernandes, M. G.; Kawasaki, H.; Klein, J. L.; Jawarani, D.; Subrahmanyan, R.; Yu, T.-K.; Pintchovski, F. · 1994