![[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - QML qualified 256 K radiation-hardened CMOS SRAM]()
[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - QML qualified 256 K radiation-hardened CMOS SRAMBrown, R.; Damato, J.; Haddad, N.; Posey, B.; Scott, T.; Murrill, S.; Groseth, J.; McGregor, S. · 1992