Determination of the Composition and Thickness of Thin Potassium Polyphosphide FilmsKiss, Klara; Figura, Paul M. · MRS Proceedings · 1985

Simultaneous determination of the compositions and thicknesses of a multilayer film using spectroreflectometryWeyburne, David W.; Paduano, Qing S. · Journal of Applied Physics · 1998

Quantitative XRF analysis of surface layers: Procedure for the determination of thickness and compositionV. Rössiger; H.-J. Thomas · 1990

Determination of the emission characteristics of evaporation sources and of the thickness and composition of mixed layersPodolesheva, I. · Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films · 1998

The determination of oxide film thickness and composition on indium and chromium by decomposition of auger electron spectraD.J. Siconolfi; R.P. Frankenthal · 1984

Nondestructive Determination of the Composition and Thickness of Thin Films of Pyrolytically Deposited Borosilicate Glass by Infrared AbsorptionTenney, A. S. · Journal of The Electrochemical Society · 1971

Determination of the Composition and Thickness of Co–Ni/Cr System Films by X-Ray FluorescenceN. I. Mashin; A. V. Ershov; A. I. Mashin; A. N. Tumanova · 2000