[IEEE 2008 American Control Conference (ACC '08) - Seattle, WA (2008.06.11-2008.06.13)] 2008 American Control Conference - Control of nano- and micro-crystalline copper electrodeposits
- 作者Trzaska, M.; Trzaska, Z. W.
- 文件大小298.18KB
- 发表时间2008
- DOI10.1109/acc.2008.4586818
- 页码2196-2201
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