![SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Micro- and Nanotechnology Sensors, Systems, and Applications V - Effects of radiation-induced defects on the charge collection efficiency of a silicon carbide particle detector]()
SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Micro- and Nanotechnology Sensors, Systems, and Applications V - Effects of radiation-induced defects on the charge collection efficiency of a silicon carbide particle detectorIwamoto, Naoya; George, Thomas; Islam, M. Saif; Onoda, Shinobu; Makino, Takahiro; Dutta, Achyut K.; Ohshima, Takeshi; Kojima, Kazutoshi; Nozaki, Shinji · 2013