![[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - The concept of resistance interval: a new parametric model for realistic resistive bridging fault]()
[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - The concept of resistance interval: a new parametric model for realistic resistive bridging faultRenovell, M.; Huc, P.; Bertrand, Y. · 1995