![SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Microsystems Engineering: Metrology and Inspection - <title>Microphotogrammetry for 3D strain measurement and microassembly control</title>]()
SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Microsystems Engineering: Metrology and Inspection - <title>Microphotogrammetry for 3D strain measurement and microassembly control</title>Tutsch, Rainer; Ritter, Reinhold; Ispas, Diana; Petz, Marcus; Casarotto, Leobaldo; Gorecki, Christophe; Jueptner, Werner P. O.; Kujawinska, Malgorzata · 2001