[ACM Press the Tenth Workshop - Paphos, Cyprus (2010.03.28-2010.03.29)] Proceedings of the Tenth Workshop on Language Descriptions, Tools and Applications - LDTA '10 - On the impact of DSL tools on the maintainability of language implementations
- 作者Klint, Paul; van der Storm, Tijs; Vinju, Jurgen
- 文件大小196.76KB
- 发表时间2010
- DOI10.1145/1868281.1868291
- 页码1-9
The Impact of Statistical Leakage Models on Design Yield EstimationKanj, Rouwaida; Joshi, Rajiv; Nassif, Sani · VLSI Design · 2011
Design Considerations for PD/SOI SRAM: Impact of Gate Leakage and Threshold Voltage VariationKanj, Rouwaida; Joshi, Rajiv V.; Sivagnaname, Jayakumaran; Kuang, Jente B.; Acharyya, Dhruva; Nguyen, Tuyet Y.; Nassif, Sani · IEEE Transactions on Semiconductor Manufacturing · 2008
Root-Finding Methods for Assessing SRAM Stability in the Presence of Random Dopant FluctuationsKanj, Rouwaida; Li, Zhuo; Joshi, Rajiv V.; Liu, Frank; Nassif, Sani R. · IEEE Transactions on Semiconductor Manufacturing · 2009
[ACM Press the 49th Annual Design Automation Conference - San Francisco, California (2012.06.03-2012.06.07)] Proceedings of the 49th Annual Design Automation Conference on - DAC '12 - Yield estimation via multi-conesKanj, Rouwaida; Joshi, Rajiv; Li, Zhuo; Hayes, Jerry; Nassif, Sani · 2012
[ACM Press Proceeding of the thirteenth international symposium - Bangalore, India (2008.08.11-2008.08.13)] Proceeding of the thirteenth international symposium on Low power electronics and design - ISLPED '08 - SRAM methodology for yield and power efficiencyKanj, Rouwaida; Joshi, Rajiv; Li, Zhou; Kuang, JB; Ngo, Hung; Zhou, Ying; Shi, Weiping; Nassif, Sani · 2008
[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Root-Finding Method for Assessing SRAM StabilityKanj, Rouwaida; Li, Zhuo; Joshi, Rajiv; Liu, Frank; Nassif, Sani · 2008
[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - SRAM Yield Sensitivity to Supply Voltage Fluctuations and Its Implications on VminKanj, Rouwaida; Joshi, Rajiv; Nassif, Sani · 2007