High-density NiSi nanocrystals embedded in Al2O3/SiO2 double-barrier for robust retention of nonvolatile memory
- 作者Jingjian Ren; Bei Li; Jian-Guo Zheng; Jianlin Liu
- 卷第67卷
- 期第1期
- 印刷ISSN0038-1101
- 文件大小685.72KB
- 发表时间2012
- DOI10.1016/j.sse.2011.07.016
- 页码23-26
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