![[IEEE 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT) - Hammamet, Tunisia (2016.12.18-2016.12.20)] 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT) - Simulation of conducted EMI in SiC MOSFET buck converters before and after aging]()
[IEEE 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT) - Hammamet, Tunisia (2016.12.18-2016.12.20)] 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT) - Simulation of conducted EMI in SiC MOSFET buck converters before and after agingDouzi, Shawki; Tlig, Mohamed; Ben Hadj Slama, Jaleleddine; Kadi, Moncef · 2016