SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 1 February 2014)] Optical Metro Networks and Short-Haul Systems VI - Blocking analysis of dynamic routing, wavelength assignment, and spectrum allocation in flexible grid WDM networks
- 作者Weiershausen, Werner; Dingel, Benjamin B.; Dutta, Achyut K.; Srivastava, Atul K.; Patel, Ankitkumar N.; Ji, Philip N.; Patel, Jigarkumar S.; Jue, Jason P.; Wang, Ting
- 卷第9008卷
- 印刷ISSN0277-786X
- 文件大小417.66KB
- 发表时间2014
- DOI10.1117/12.2039802
Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging testsDouzi, Shawki; Kadi, Moncef; Boulzazen, Habib; Tlig, Mohamed; Ben Hadj Slama, Jaleleddine · Microelectronics Reliability · 2018
Radiated EMI evolution of power SiC MOSFET in a boost converter after short-circuit aging testsDouzi, Shawki; Kadi, Moncef; Boulzazen, Habib; Tlig, Mohamed; Ben Hadj Slama, Jaleleddine · Microelectronics Reliability · 2019
[IEEE MELECON 2012 - 2012 16th IEEE Mediterranean Electrotechnical Conference - Yasmine Hammamet, Tunisia (2012.03.25-2012.03.28)] 2012 16th IEEE Mediterranean Electrotechnical Conference - Effect of the MOSFET choice on conducted EMI in power converter circuitsSlama, Jaleleddine Ben Hadj; Tlig, Mohamed · 2012
[IEEE 2017 International Conference on Information and Digital Technologies (IDT) - Zilina, Slovakia (2017.7.5-2017.7.7)] 2017 International Conference on Information and Digital Technologies (IDT) - Simulation of conducted EMI in SiC MOSFET buck converters before and after agingDouzi, Shawki; Tlig, Mohamed; Slama, Jaleleddine Ben Hadj; Kadi, Moncef · 2017
[IEEE 2013 10th International Multi-Conference on Systems, Signals & Devices (SSD) - Hammamet, Tunisia (2013.03.18-2013.03.21)] 10th International Multi-Conferences on Systems, Signals & Devices 2013 (SSD13) - Power RF N-LDMOS ageing effect on conducted electromagnetic interferencesTlig, Mohamed; Ben Hadj Slama, Jaleleddine; Belaid, M.A · 2013
[IEEE 2014 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM) - Tunis, Tunisia (2014.11.3-2014.11.6)] 2014 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM) - Experimental study on the EMI and switching time evolution of IGBT devices after operating aging testsTlig, Mohamed; Ben Hadj Slama, Jaleleddine; Belaid, M.A · 2014
[IEEE 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT) - Hammamet, Tunisia (2016.12.18-2016.12.20)] 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT) - Simulation of conducted EMI in SiC MOSFET buck converters before and after agingDouzi, Shawki; Tlig, Mohamed; Ben Hadj Slama, Jaleleddine; Kadi, Moncef · 2016