Photocatalysis from UV/Vis to Near-Infrared Light: Towards Full Solar-Light Spectrum Activity
- 期刊名称ChemCatChem
- 作者Sang, Yuanhua; Liu, Hong; Umar, Ahmad
- 卷第7卷
- 期第4期
- 印刷ISSN1867-3880
- 文件大小3243.49KB
- 发表时间2015-02
- DOI10.1002/cctc.201402812
- 页码559-573
Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized DescriptorsRajeev R. Rao; Kaviraj Chopra; David T. Blaauw; Dennis M. Sylvester · 2007
Circuit optimization techniques to mitigate the effects of soft errors in combinational logicRao, Rajeev R.; Joshi, Vivek; Blaauw, David; Sylvester, Dennis · ACM Transactions on Design Automation of Electronic Systems · 2009
[ACM Press the 41st annual conference - San Diego, CA, USA (2004.06.07-2004.06.11)] Proceedings of the 41st annual conference on Design automation - DAC '04 - Parametric yield estimation considering leakage variabilityRao, Rajeev R.; Devgan, Anirudh; Blaauw, David; Sylvester, Dennis · 2004
[ACM Press the 2005 international symposium - San Francisco, California, USA (2005.04.03-2005.04.06)] Proceedings of the 2005 international symposium on physical design - ISPD '05 - An efficient surface-based low-power buffer insertion algorithmRao, Rajeev R.; Blaauw, David; Sylvester, Dennis; Alpert, Charles J.; Nassif, Sani · 2005
[ACM Press the 2003 international symposium - Seoul, Korea (2003.08.25-2003.08.27)] Proceedings of the 2003 international symposium on Low power electronics and design - ISLPED '03 - Statistical estimation of leakage current considering inter- and intra-die process variationRao, Rajeev; Srivastava, Ashish; Blaauw, David; Sylvester, Dennis · 2003
[ACM Press the 41st annual conference - San Diego, CA, USA (2004.06.07-2004.06.11)] Proceedings of the 41st annual conference on Design automation - DAC '04 - Leakage-and crosstalk-aware bus encoding for total power reductionDeogun, Harmander S.; Rao, Rajeev R.; Sylvester, Dennis; Blaauw, David · 2004
[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - Soft error reduction in combinational logic using gate resizing and flipflop selectionRao, Rajeev R.; Blaauw, David; Sylvester, Dennis · 2006